Work

Investigation on Trench Edge Termination in SiC Based Power Device

Year: 2023

Type: book-chapter

Source: Lecture notes in electrical engineering

DOI: 10.1007/978-981-19-7993-4_44

Authors: Reena Rathi, Ekta Sharma, Vamshi Krishna Dasarraju

Institutions: Chaudhary Ranbir Singh University, Northern Illinois University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4367358736

FWCI:

Cites: 35

Cited by:

Related to: 10