Work

Investigation of hygrothermally induced failures in multilayer ceramic capacitors during thermal reflow process

Year: 2023

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/j.microrel.2023.115028

Authors: Rilwan Kayode Apalowo, Aizat Abas, Zuraihana Bachok, Mohamad Fikri Mohd Sharif, Fakhrozi Che Ani, Mohamad Riduwan Ramli, Muhamed Abdul Fatah bin Muhamed Mukhtar

Institutions: Universiti Sains Malaysia, Federal University of Technology

Language: English

Topic: Electronic Packaging and Soldering Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4378450641

FWCI: 1.283

Cites: 30

Cited by: 18

Related to: 10