Deep-Learning Model for Buildup of Ionization Defects in Bipolar Junction Transistors
Year: 2023
Type: article
Authors: Lei Li, Xiao-Chi Chen, Gui-Xia Yang
Institution: China Academy of Engineering Physics
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G8372860958
OpenAlex ID: W4385257588