Work

Late Breaking Results: Test Selection For RTL Coverage By Unsupervised Learning From Fast Functional Simulation

Year: 2023

Type: conference-paper

Source: ACM/IEEE Design Automation Conference (DAC)

DOI: 10.1109/dac56929.2023.10247936

Authors: Rongjian Liang, Nathaniel Pinckney, Yuji Chai, Haoxin Ren, Brucek Khailany

Institutions: Nvidia (United States), Harvard University

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4386764844

FWCI: 1.239

Cites: 4

Cited by: 7

Related to: 10