Work

Garment Defect Detection System Based on Histogram Using Deep Learning

Year: 2023

Type: conference-paper

Source: Lecture notes in networks and systems

DOI: 10.1007/978-981-99-3716-5_22

Authors: Mayur Rahul, Namita Tiwari, Ayushi Prakash, Vikash Yadav

Institutions: Chhatrapati Shahu Ji Maharaj University, ABES Engineering College, Government of Uttar Pradesh

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4386804871

FWCI: 1.653

Cites: 37

Cited by: 4

Related to: 10