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HIL testing and future-proofing of UFLS schemes

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Year: 2023
Type: conference-paper
Source: IET conference proceedings.
DOI: 10.1049/icp.2023.0766
Authors: P. Favre-Perrod, M. Schueller, N. Stieger, M. Burri, W. Sattinger, B. Wartmann
Institutions: HES-SO University of Applied Sciences and Arts Western Switzerland, OST - Ostschweizer Fachhochschule, University of Applied Sciences of Eastern Switzerland
Language: English

Topic: Frequency Control in Power Systems
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
SDG: Industry, innovation and infrastructure

Open Access status: closed
OpenAlex ID: W4387068614
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Related to: 10
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