HIL testing and future-proofing of UFLS schemes
Year: 2023
Type: conference-paper
Source: IET conference proceedings.
Authors: P. Favre-Perrod, M. Schueller, N. Stieger, M. Burri, W. Sattinger, B. Wartmann
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4387068614
