Work

Polarization phase shifting for thickness measurement of NiO material transport layer using Sagnac interferometer

Year: 2023

Type: conference-paper

Source: SPIE Applied Optical Metrology

DOI: 10.1117/12.2678176

Authors: Abdullahi Usman, Pachara Thonglim, Apichai Bhatranand, Samuk Pimanpang, Prathan Buranasiri

Institutions: King Mongkut's University of Technology Thonburi, Srinakharinwirot University, King Mongkut's Institute of Technology Ladkrabang

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4387329015

FWCI:

Cites: 12

Cited by:

Related to: 10