Work

Research on Self-Learning Flaw Detection in Ultrasonic C-Scan Non-Destructive Testing

Year: 2023

Type: conference-paper

Source: IEEE International Conference on Electronic Measurement & Instruments

DOI: 10.1109/icemi59194.2023.10270734

Authors: Zhipeng Li, Yibing Shi, Yanjun Li, Wei Zhang, Ao Qiu

Institution: University of Electronic Science and Technology of China

Language: English

Topic: Ultrasonics and Acoustic Wave Propagation

Subfield: Mechanics of Materials

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: China National Offshore Oil Corporation

OpenAlex ID: W4387486175

FWCI: 2.488

Cites: 20

Cited by: 2

Related to: 10