Work

Analysis of RF with DC and Linearity Parameter and Study of Noise Characteristics of Gate‐All‐Around Junctionless FET (GAA‐JLFET) and Its Applications

Year: 2023

Type: book-chapter

Source: Wiley eBooks

DOI: 10.1002/9781394186396.ch6

Authors: Pratikhya Raut, Umakanta Nanda, Deepak Kumar Panda

Institutions: Siddhartha Academy of Higher Education, VIT-AP University, Amrita Vishwa Vidyapeetham

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4387705183

FWCI: 1.652

Cites: 33

Cited by: 2

Related to: 10