Work

A Correlative Study of Silicon Carbide Power Devices Using Atom Probe Tomography and Transmission Electron Microscopy

Year: 2023

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2023p0500

Authors: Ramya Cuduvally, Bavley Guerguis, Brian Langelier, Nabil D. Bassim, Ramya Cuduvally, Carmen M. Andrei, Travis Casagrande, Gabriel A. Arcuri, Brian Langelier, Nabil D. Bassim, Stephen Russell

Institution: McMaster University

Language: English

Topic: Advanced Materials Characterization Techniques

Subfield: General Materials Science

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4388494366

FWCI: 1.666

Cites:

Cited by: 2

Related to: 10