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Comparative Analysis of Existing Deep Learning Techniques for Automatic Defects Detection in Printed Circuit Boards

Year: 2023

Type: conference-paper

Source: International Conference on Technological Advancements in Computational Sciences (ICTACS)

DOI: 10.1109/ictacs59847.2023.10390098

Authors: Nikhil Aggarwal, Manish Deshwal, Piyush Samant

Institutions: Chandigarh University, MiRXES Lab Pte. Ltd. (Singapore)

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4391237278

FWCI: 1.24

Cites: 19

Cited by: 3

Related to: 10