Work

A 3.36- μ m-Pitch SPAD Photon-Counting Image Sensor Using a Clustered Multi-Cycle Clocked Recharging Technique With an Intermediate Most-Significant-Bit Readout

Year: 2024

Type: article

Source: IEEE Journal of Solid-State Circuits

DOI: 10.1109/jssc.2024.3360150

Authors: Takafumi Takatsuka, Jun Ogi, Yasuji Ikeda, Kazuki Hizu, Yutaka Inaoka, Shunsuke Sakama, Iori Watanabe, Tatsuya Ishikawa, Shohei Shimada, Junki Suzuki, Hidenori Maeda, Kenji Toshima, Yusuke Nonaka, Akifumi Yamamura, Hideki Ozawa, Fumihiko Koga, Yusuke Oike

Institutions: Sony Semiconductor Solutions Corporation (Japan), Sony Semiconductor Manufacturing (Japan)

Language: English

Topic: CCD and CMOS Imaging Sensors

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4391661539

FWCI: 1.713

Cites: 22

Cited by: 18

Related to: 10