Work

MD-YOLO: Surface Defect Detector for Industrial Complex Environments

Year: 2024

Type: article

Source: Optics and Lasers in Engineering

DOI: 10.1016/j.optlaseng.2024.108170

Authors: Hongxin Zheng, Xiaoxin Chen, Hao Cheng, Yixian Du, Zhansi Jiang

Institution: Guilin University of Electronic Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Ministry of Science and Technology of the People's Republic of China, Guangdong Science and Technology Department, Education Department of Guangxi Zhuang Autonomous Region

OpenAlex ID: W4393965003

FWCI: 10.8

Cites: 37

Cited by: 68

Related to: 10