Work

U2D2PCB: Uncertainty-Aware Unsupervised Defect Detection on PCB Images Using Reconstructive and Discriminative Models

Year: 2024

Type: article

Source: IEEE Transactions on Instrumentation and Measurement

DOI: 10.1109/tim.2024.3386210

Authors: Changlin Chen, Qiman Wu, Jin Zhang, Haojie Xia, Pengrong Lin, Yong Wang, Mengke Tian, Rencheng Song

Institutions: Hefei University of Technology, Beijing Microelectronics Technology Institute

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4394585994

FWCI: 3.064

Cites: 47

Cited by: 21

Related to: 10