Work

Research on apple surface defect detection based on improved YOLOv8

Year: 2024

Type: conference-paper

Source: IEEE Advanced Information Technology, Electronic and Automation Control Conference (IAEAC)

DOI: 10.1109/iaeac59436.2024.10503873

Authors: Hua Yang, Haifeng Zhang, Jie Xiao, Qi Wang, Shenyang Sheng, Chengwu Peng, Tiancheng Zhang

Institution: Wuhan Polytechnic University

Language: English

Topic: Smart Agriculture and AI

Subfield: Plant Science

Field: Agricultural and Biological Sciences

Domain: Life Sciences

SDG: Zero hunger

Open Access status: closed

OpenAlex ID: W4395479212

FWCI: 1.794

Cites: 14

Cited by: 3

Related to: 10