Work

Light-triggered defect dynamics in silicon wafers: understanding degradation mechanisms

Year: 2024

Type: article

Source: Applied Physics A

DOI: 10.1007/s00339-024-07511-w

Authors: Yougherta Chibane, Yacine Kouhlane, Djoudi Bouhafs, Wafa Achour, Asmaa Mohammed-Krarroubi, Amar Khelfane

Institutions: Badji Mokhtar-Annaba University, Centre de Recherche en Technologie des Semi-conducteurs pour l’Energétique

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Direction Générale de la Recherche Scientifique et du Développement Technologique

OpenAlex ID: W4396608596

FWCI: 0.394

Cites: 80

Cited by: 4

Related to: 10