Work

Quantitative accuracy assessment of trace elements and halogens in apatite by time-of-flight secondary ion mass spectrometry (TOF-SIMS)

Year: 2024

Type: article

Source: Journal of Analytical Atomic Spectrometry

DOI: 10.1039/d4ja00034j

Authors: Meng-Qin Wang, Ke-Da Cai, Zhan-Ping Li, Chong Guo

Institutions: China University of Geosciences, China University of Geosciences (Beijing), State Key Laboratory of Geological Processes and Mineral Resources, Tsinghua University

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Key Research and Development Program of China

Award: G2948510578

OpenAlex ID: W4396891007

FWCI: 0.558

Cites: 34

Cited by: 5

Related to: 10