Work

Integration of AI and Machine Learning in Semiconductor Manufacturing for Defect Detection and Yield Improvement

Year: 2024

Type: article

Abstract: The integration of Artificial Intelligence (AI) and Machine Learning (ML) into semiconductor manufacturing has revolutionized defect detection and yield improvement processes. AI and ML algorithms analyze vast amounts of data generated during fabrication to enhance quality control, reduce defects, and optimize production yields. This paper provides an overview of AI and ML applications in semiconductor manufacturing, focusing on their roles in defect detection methodologies, process optimization, and yield enhancement strategies. Case studies and current advancements illustrate the transformative impact of AI and ML technologies on semiconductor fabrication, highlighting their potential to drive future advancements in microelectronics.

Source: Journal of Artificial Intelligence General science (JAIGS)

DOI: 10.60087/jaigs.v3i1.191

Authors: Monish Katari, Lavanya Shanmugam, Jesu Narkarunai Arasu Malaiyappan

Institutions: Marvell (United States), Meta (United States)

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: hybrid

OpenAlex ID: W4400405486

FWCI: 1.459

Cites:

Cited by: 10

Related to: 10