Work

Deep Learning Detection of Defect-Free Bangles: Machine Vision Approach for Quality Assurance in Bangle Manufacturing

Year: 2023

Type: conference-paper

Source: International Engineering Conference on Electrical, Energy, and Artificial Intelligence (EICEEAI)

DOI: 10.1109/eiceeai60672.2023.10590367

Authors: Helcy D. Alon, Alvin Sarraga Alon, Ryan S. Evangelista, Michael Angelo Delos Santos Ligayo, Ryan Reyes, Michelle C. Reyes, Jovencio Merin, Yolanda D. Austria

Institutions: Batangas State University, Quezon City University, Technological University of the Philippines, Far Eastern University – Dr. Nicanor Reyes Medical Foundation, Adamson University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4400772005

FWCI:

Cites: 14

Cited by:

Related to: 10