Work

Thin textured CdTe films on silicon and sapphire substrates: thermal vapor deposition and structural characterization

Year: 2024

Type: article

Abstract: Thin films of CdTe were grown on Si (111) and Al2O3 (0001) substrates by thermal deposition from the gas phase. The obtained films were studied using atomic force microscopy, scanning electron microscopy, and X-ray diffraction analysis. It was found that on Al2O3 (0001) substrates, thin films of both wurtzite and sphalerite modifications of CdTe can be obtained. On Si substrates, thin films of the sphalerite modification of CdTe can be obtained. It is shown that the elemental composition of thin films is close to stoichiometry, and in the case of thin films grown on Al2O3 (0001), the deviation did not exceed 1 at. %.

Source: Кристаллография

DOI: 10.31857/s0023476124020151

Authors: I. O. Koshelev, I. S. Volchkov, P. L. Podkur, D. R. Khairetdinova, I. M. Doludenko, V. M. Kanevsky

Institutions: Kurchatov Institute, A.V. Shubnikov Institute of Crystallography, National University of Science and Technology

Language: English

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W4400839733

FWCI:

Cites: 13

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Related to: 10