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Computer Vision for Automated Quality Inspection in Manufacturing

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Year: 2024
Type: conference-paper
Source: International Conference on Advances in Computing, Communication and Applied Informatics (ACCAI)
DOI: 10.1109/accai61061.2024.10601894
Authors: Kasharaju Balakrishna, Vidhika Tiwari, Arati V. Deshpande, Sunilkumar Rajaram Patil, Ajay Kumar Garg, B. T. Geetha
Institutions: SR University, Vishwakarma Institute of Technology, Bharati Vidyapeeth (Deemed to be University), University of Delhi, Saveetha University
Language: English

Topic: Industrial Vision Systems and Defect Detection
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
SDG: Industry, innovation and infrastructure

Open Access status: closed
OpenAlex ID: W4400977104
FWCI: 2.446
Cites: 8
Cited by: 4
Related to: 10
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