Work

Improvement of Boron Dopant Quantification Accuracy in Atom Probe Tomography via High Electric Field Analysis

Year: 2024

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1093/mam/ozae044.036

Authors: Bavley Guerguis, Ramya Cuduvally, Richard J H Morris, Gabriel Arcuri, Brian Langelier, Nabil Bassim

Institutions: McMaster University, Canadian Centre for Electron Microscopy, IMEC

Language: English

Topic: Advanced Materials Characterization Techniques

Subfield: General Materials Science

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4401006491

FWCI:

Cites: 4

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Related to: 10