Work

Development of Electron-Beam Induced Soft X-ray and Vacuum Ultraviolet Emission Spectrometer

Year: 2024

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1093/mam/ozae044.098

Authors: Shogo Koshiya, Takanori Murano, Peter McSwiggen, Vern Robertson

Institutions: JEOL (Japan), JEOL (United States)

Language: English

Topic: X-ray Spectroscopy and Fluorescence Analysis

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4401006573

FWCI: 0.795

Cites: 3

Cited by: 3

Related to: 10