29‐4: TOF SIMS for OLED Film 3D Detection and Real‐Time Failure Analysis
Year: 2024
Type: conference-paper
DOI: 10.1002/sdtp.17536
Authors: Kening Zheng, Qiang Fu, Bo Shi, Long Chen, Dongyu Gao, Li Zhu, Langtao Li, Dengyu Wang, Xuenan Pan, Kai Zhang, Dongfang Yang, Guoqiang Tang, Fujiang Jin
Institution: BOE Technology Group (China)
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4401124271
