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Quality control and inspection reliability of the PCB manufacturing process through convolutional networks

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Year: 2024
Type: book-chapter
Source: Elsevier eBooks
DOI: 10.1016/b978-0-443-13242-1.00014-x
Authors: Noel Cortés-Perez, Ismael López-Juárez, José Antonio Vázquez-López, Aideé Hernández-López, Luz Abril Torres-Méndez, José Luis Navarro-González, Abdelkader El Kamel
Institutions: Centro de Investigación y de Estudios Avanzados del Instituto Politécnico Nacional, Tecnológico Nacional de México, Technological Institute of Celaya, Centre de Recherche en Informatique, Signal et Automatique de Lille, Centrale Lille Institut
Language: English

Topic: Industrial Vision Systems and Defect Detection
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
SDG: Industry, innovation and infrastructure

Open Access status: closed
OpenAlex ID: W4401650896
FWCI: 1.401
Cites: 14
Cited by: 2
Related to: 10
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