Work

Nuclear Scanning Microprobe Analysis of Silicon Carbide Epilayers

Year: 2024

Type: article

Source: Bulletin of the Russian Academy of Sciences Physics

DOI: 10.1134/s1062873824707463

Authors: M. E. Buzoverya, I. A. Karpov, A. Yu. Arkhipov, D. A. Skvortsov, V. A. Neverov, B. F. Mamin

Institution: National Research Mordovia State University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4401945477

FWCI:

Cites: 6

Cited by:

Related to: 10