Optical Coherence Tomography of Van Der Waals Heterostructures Using Extreme Ultraviolet Light
Year: 2024
Type: article
Abstract: New experimental methods with high out‐of‐plane spatial sensitivity combined with ultrafast temporal resolution can revolutionize the understanding of charge‐ and heat‐transfer dynamics occurring at interfaces. In this work, a step forward is taken in this direction by applying coherence tomography with extreme ultraviolet (EUV) light to different van der Waals heterostructures, which enables a 3D sample reconstruction with nanoscopic axial resolution. Furthermore, the measurements and, more in general, the approach is confirmed by ab initio calculations of the refractive index of layered materials that we compare to existing databases of empirical data. The EUV coherence tomography contrast is estimated in a broad spectral range (photon energy 65 –100 eV). This work sets the basis for the development of a new spectroscopy tool that, thanks to the temporal profile of EUV light sources and the high axial resolution of coherence tomography, can become the ideal probe of ultrafast processes occurring in van der Waals heterostructures and buried nanoscale opto‐electronic devices.
Source: Advanced Materials Interfaces
Institutions: Friedrich Schiller University Jena, Brazilian Center for Research in Energy and Materials, Laboratório Nacional de Nanotecnologia, Humboldt-Universität zu Berlin, Freie Universität Berlin, Carl von Ossietzky Universität Oldenburg, Helmholtz Institute Jena, GSI Helmholtz Centre for Heavy Ion Research, Hochschule Mittweida
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $3,100
Funders: Europäischer Sozialfonds, Carl von Ossietzky Universität Oldenburg, Deutsche Forschungsgemeinschaft, Bundesministerium für Bildung und Forschung, Fraunhofer-Gesellschaft, Conselho Nacional de Desenvolvimento Científico e Tecnológico, Max-Planck-Gesellschaft, Thüringer Aufbaubank, Niedersächsisches Ministerium für Wissenschaft und Kultur, European Social Fund
Awards: G1331233524, G1572456354, G1575856863, SFB 1375: Nichtlineare Optik bis hin zu atomaren Skalen, G218035419, G2331847522, G3388439106, G3573082562, G390482800, G5200743168, G5635066468, G5712227735, SFB 951: Hybrid Inorganic/Organic Systems (HIOS) for OptoElectronics, G7080222162, 200kV Transmissionselektronenmikroskop, G7525634407, G7890451707, G8413652850, G996214329
OpenAlex ID: W4402148702