Kill Two Birds with One Stone: Cracking Lithography Technology for High-Performance Flexible Metallic Network Transparent Conductors and Metallic Micronano Sheets
Year: 2024
Type: article
Authors: Jingxin Yan, Zhen Wang, Wenya Bai, Chengyun Wang, Yue Jiang, Xinbo Shi, Yiwang Chen, Jun-Ming Liu, Jinwei Gao
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403565294
