Work

Comparative Study of Keypoint Detection and ArUco Marker Methods for Optical 6D Pose Estimation in Electronics Packaging

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Automation Science and Engineering (CASE)

DOI: 10.1109/case59546.2024.10711641

Authors: Lucas Janisch, Daniel Schulz, Alexander Schmidt, Raven Reisch, Tobias Kamps, Jörg Franke

Institutions: Friedrich-Alexander-Universität Erlangen-Nürnberg, Rosenheim Technical University of Applied Sciences, Siemens (Germany)

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403676549

FWCI: 1.244

Cites: 29

Cited by: 2

Related to: 10