Work

Top Layer Localization in Stacked PCB Boards Using YOLOv8 and Self- generated Data

Year: 2024

Type: conference-paper

Source: International Conference on Intelligent Robotics and Control Engineering (IRCE)

DOI: 10.1109/irce62232.2024.10739806

Authors: Fan Qin, Bitao Zhang

Institution: Hong Kong University of Science and Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404102121

FWCI:

Cites: 11

Cited by:

Related to: 10