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Few-Shot Anomaly-Driven Generation for Anomaly Classification and Segmentation

Year: 2024

Type: conference-paper

Source: Lecture notes in computer science

DOI: 10.1007/978-3-031-73010-8_13

Authors: Guan Gui, Bin-Bin Gao, Jun Liu, Chengjie Wang, Yunsheng Wu

Institutions: Tencent (China), Shanghai Jiao Tong University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W4404199604

FWCI: 18.04

Cites: 44

Cited by: 29

Related to: 10