Year: 2024
Type: article
Abstract: Front Cover: In article 2400213, Davood Abbaszadeh, Ali-Reza Moradi, and co-workers demonstrate the innovative approach of speckle pattern statistical analysis for memristor devices characterization while they are in operation. The method is non-invasive, remote, and probeless. Analyzing the speckle patterns of PVK:rGO memristors in their ON/OFF states provides insights into resistance mechanism and information on the distribution of charge carriers.
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $3,000
OpenAlex ID: W4405436552