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Accelerate SEU Simulation-Based Fault Injection With Spatio-Temporal Graph Convolutional Networks

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Year: 2025
Type: article
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI: 10.1109/tcad.2025.3526748
Authors: Li Lu, Junchao Chen, Aneesh Balakrishnan, Markus Ulbricht, Milos Krstic
Institution: Leibniz Institute for High Performance Microelectronics
Language: English

Topic: Radiation Effects in Electronics
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed

Funders: Bundesministerium für Bildung und Forschung, Ministry of Education and Research, Romania
Awards: Verbundprojekt: Entwicklungsplattform und Ökosystem für skalierbare Spezialprozessoren im Edge-Computing - Scale4Edge-, Teilvorhaben: Hochzuverlässige RISC-V-Prozessoren, G1165601613, Verbundprojekt: Härtung der Wertschöpfungskette durch quelloffene, vertrauenswürdige EDA-Tools und Prozessoren - VE-HEP -, Teilvorhaben: Verifikation von quelloffenen EDA-Tools und Prozessoren (VEP)
OpenAlex ID: W4406089798
FWCI: 1.37
Cites: 35
Cited by: 7
Related to: 10
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