Work

Lifetime Prediction of Electrothermally-Stressed Semiconductor Devices in Si/SiC H-ANPC Inverter

Year: 2024

Type: conference-paper

Source: IEEE Energy Conversion Congress and Exposition (ECCE)

DOI: 10.1109/ecce55643.2024.10861730

Authors: Nanditha Gajanur, Mohammad A. Abbaszada, Sudip K. Mazumder, Matt Ursino, Patrick McCluskey

Institution: University of Illinois Chicago

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Affordable and clean energy, Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4407304301

FWCI: 1.469

Cites: 15

Cited by: 2

Related to: 10