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Research on Image Object Fault Detection Based on Deep Learning

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Automation, Electronics and Electrical Engineering (AUTEEE)

DOI: 10.1109/auteee62881.2024.10869678

Author: Leilei Shi

Institution: Shandong Vocational College of Light Industry

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407474792

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