Work

A Benchmarking Study on IGBT Thermal-Electrical Performance Using Finite Element Analysis and Design of Experiments (DOE)

Year: 2025

Type: article

Source: Journal of Electrical Engineering and Technology

DOI: 10.1007/s42835-025-02178-6

Authors: Na-Yeon Choi, Dong-Hyeon Kim, Sangmin Nam, Yun-Jae Lee, Sang-Gi Kim, Sung-Uk Zhang

Institution: Dong-Eui University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Affordable and clean energy, Industry, innovation and infrastructure

Open Access status: closed

Funders: Ministry of Education, Ministry of Trade, Industry and Energy

OpenAlex ID: W4407724593

FWCI: 0.587

Cites: 24

Cited by: 3

Related to: 10