Thermal diffusivity microscope: Zooming in on anisotropic heat transport
Year: 2025
Type: article
Abstract: Anisotropic heat conducting materials, where heat flows faster in one direction than another, play crucial roles in designing electronic, optoelectronic, and thermoelectric devices, where temperature and thermal stress are important. Despite significant research efforts, a major obstacle to determining the anisotropic thermal diffusivity tensor in polycrystalline systems is the need for a robust, direct, and non-destructive technique to distinguish between distinct thermal diffusivities. Here, we demonstrate a conceptually new thermal diffusivity microscope capable of performing high-resolution local measurements of anisotropic thermal diffusivity. The microscope is based on a unique micro four-point probe, providing fast, nondestructive scanning and calibration-free measurements. Through a series of experiments, we demonstrate that the anisotropy of the thermal diffusivity correlates excellently with the crystallographic direction of prototypical Bi2Te3. Our results provide insights into the complex anisotropic heat transport and show that the lattice contribution dominates the heat transport for both in- and out-of-plane directions.
Source: Science Advances
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $4,500
Funders: Villum Fonden, Innovationsfonden, European Commission, Fonds Wetenschappelijk Onderzoek, Novo Nordisk, Danmarks Frie Forskningsfond, Technion-Israel Institute of Technology, Russell Berrie Nanotechnology Institute, Technion-Israel Institute of Technology, Universiteit Antwerpen, Novo Nordisk Fonden, Vlaamse regering, HORIZON EUROPE Framework Programme, Asher Space Research Institute, Technion-Israel Institute of Technology, HORIZON EUROPE European Research Council
Awards: Next Generation of Artificial Heterointerfaces as Building Blocks for Energy Materials, G2375618255, G2406950486, DYNAmics and STructural analYsis of 2D materials, G434337789, G4711474426, G5000973715, Electron beams enhancing analytical microscopy, Automated Electron diffractometer for high throughput identification of nanocrystalline materials, G8615870599
OpenAlex ID: W4407948828
