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Highly-reliable ferroelectric thin-film transistors array for hardware implementation of image classification

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Year: 2025
Type: article
Source: Journal of Material Science and Technology
DOI: 10.1016/j.jmst.2024.12.078
Authors: Peng Yang, Peiwen Tong, Hui Xu, Sen Liu, Changlin Chen, Yefan Zhang, Shihao Yu, Wei Wang, Rongrong Cao, Haijun Liu, Lei Liao, Qingjiang Li
Institution: National University of Defense Technology
Language: English

Topic: Ferroelectric and Negative Capacitance Devices
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Key Research and Development Program of Jiangxi Province, Key Research and Development Program of Hunan Province of China
Awards: G2127820163, G4283880933, G6662032220, G8330560773, G895288870
OpenAlex ID: W4408085765
FWCI: 2.177
Cites: 46
Cited by: 11
Related to: 10
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