Work

Fast reverse engineering of chips using lasers, Focused Ion Beams, and confocal and scanning electron microscopy

Year: 2025

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/j.microrel.2025.115697

Authors: Matthew Maniscalco, Hongbin Choi, Adrian Phoulady, Alexander Blagojevic, Toni Moore, Mohammad Taghi Mohammadi Anaei, Parisa Mahyari, Nicholas May, Sina Shahbazmohamadi, Pouya Tavousi

Institutions: University of Connecticut, Manhattan University

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Air Force Research Laboratory

OpenAlex ID: W4408400902

FWCI: 0.989

Cites: 19

Cited by: 5

Related to: 10