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Analyzing Machine Learning Techniques for Software Defect Prediction: A Comprehensive Performance Comparison

Year: 2024

Type: conference-paper

Source: Asian Conference on Intelligent Technologies (ACOIT)

DOI: 10.1109/acoit62457.2024.10939610

Author: Sai Krishna Gunda

Institution: Home Depot (United States)

Language: English

Topic: Software Engineering Research

Subfield: Information Systems

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409103769

FWCI: 11.31

Cites: 10

Cited by: 49

Related to: 10