Measurement of Transient Responses in RF Circuits Using a Spectrum Analyzer
Year: 2024
Type: conference-paper
Source: IEEE India Conference
Authors: Sujay S, Vasanthi T L, Shrawan Kumar Patel, Mrinal Kanti Mandal
Institution: Indian Institute of Technology Kharagpur
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4409641998
