Work

Tailoring Electrical Stability of Indium Oxide Thin-Film Transistors via Solution Aging-Induced Defect Modulation

Year: 2025

Type: article

Source: ACS Applied Electronic Materials

DOI: 10.1021/acsaelm.5c01021

Authors: Juwon Kim, Seung-Jin Lee, Won-Ju Cho, Hamin Park

Institution: Kwangwoon University

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Kwangwoon University, Ministry of Education, Ministry of Trade, Industry and Energy, Ministry of Science and ICT, South Korea

Awards: G2297553284, G379530431, G6668848437

OpenAlex ID: W4411713601

FWCI: 1.37

Cites: 37

Cited by: 7

Related to: 10