A Fallible Design Language Network for Assessing Design Change Risk In the Early Stage of Design
Year: 2025
Type: preprint
Source: SSRN Electronic Journal
DOI: 10.2139/ssrn.5333039
Authors: Yusuke Tsutsui, Yuga Suzuki, Yoshiki Shimomura, Akira Tsumaya
Institution: Tokyo Metropolitan University
Language: English
Subfield: Management of Technology and Innovation
Domain: Social Sciences
Open Access status: green
OpenAlex ID: W4411889296