Work

From Thin Film to Battery: FIB-SIMS with TOF Technology for High Resolution Chemical Imaging

Year: 2025

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1093/mam/ozaf048.003

Authors: Lex Pillatsch, Valentine Riedo-Grimaudo, James Whitby

Institution: Tofwerk (Switzerland)

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4412909147

FWCI: 0.234

Cites: 4

Cited by: 1

Related to: 10