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Highly Tunable Synaptic Modulation in Photo‐Activated Remote Charge Trap Memory for Hardware‐Based Fault‐Tolerant Learning

Year: 2025

Type: article

Source: Advanced Materials

DOI: 10.1002/adma.202515140

Authors: Je‐Jun Lee, Hojin Choi, Ju‐Hee Lee, Jiwon Moon, Taehyuk Jang, Byoung‐Soo Yu, Sang Yeon Kim, Jeong‐Ick Cho, Seong‐Jun Han, Hyung‐Jun Kim, Do Kyung Hwang, Seyong Oh, Jin‐Hong Park

Institutions: Korea Institute of Science and Technology, Sungkyunkwan University, Korea University of Science and Technology, Korea University, Hanyang University

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Korea Institute of Science and Technology, National Research Foundation of Korea, KU-KIST Graduate School of Converging Science and Technology, Samsung

Awards: G2107314465, G2287092703, G2413892968, G3039248370, G3250224180, G3880184860, G4627007323, G510038388, G5311628009, G6743571317

OpenAlex ID: W4414780902

FWCI: 0.911

Cites: 59

Cited by: 4

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