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Otimização Do Processo De Inspeção De Chapas Com Inteligência Artificial

Year: 2025

Type: conference-paper

Source: Seminário de Automação & TI

DOI: 10.5151/2594-5335-42590

Authors: Erik de Souza Couto, Luis Fernando de Almeida, Wesley Rossi Pimenta, Daniel Costa Trocades, Regis Fonseca de Oliveira, Yuri Lucas de Souza Paropat, Maycon Lacerda de Oliveira, Silvio de Carvalho Sabença

Language: Portuguese

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4414911331

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