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Inverter Open Circuit Failure Detection Method via Residual Inner Product Feature

Year: 2025

Type: conference-paper

Source: Chinese Control Conference (CCC)

DOI: 10.23919/ccc64809.2025.11179022

Authors: Tianyu Sun, Chaobo Chen, Jiawei Dai, Binbin Zhang, Song Gao

Institution: Xi'an Technological University

Language: English

Topic: Fault Detection and Control Systems

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4415034288

FWCI: 2.418

Cites: 19

Cited by: 1

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