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Industrial Defect Comprehensive Evaluation Based on Gated Multilayer Perceptron

Year: 2025

Type: conference-paper

Source: Chinese Control Conference (CCC)

DOI: 10.23919/ccc64809.2025.11178905

Authors: Jiacheng Yi, Xiaoyao Li, Zhe Zhang, Can Ding, Gufeng Gong, Yang Xiao

Institutions: Central South University of Forestry and Technology, Hunan University, Guangxi Minzu University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4415048844

FWCI:

Cites: 13

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Related to: 10