Work

Time-Dependent Quantized Conductance Degradation in High-K Switching Devices Treated with H-Plasma

Year: 2025

Type: conference-abstract

Source: ECS Meeting Abstracts

DOI: 10.1149/ma2025-02171182mtgabs

Authors: Aseel Zeinati, Durga Misra, Dina H. Triyoso, Kandabara Tapily, Robert D Clark, Sarah Lombardo, Cory S Wajda, Gert J Leusink

Institutions: New Jersey Institute of Technology, Tokyo Electron (Japan)

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4416601307

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