Work

Submicron External Electro-optic Measuring System Based on an Electro-optic Solid Immersion Lens

Year: 2001

Type: article

Source: International Journal of Infrared and Millimeter Waves

DOI: 10.1023/a:1010645726332

Authors: Zhanguo Chen, Gang Jia, Yunlong Liu, Zhifa Wu, Chao Zhao, Maobin Yi

Institutions: Jilin University, State Key Laboratory on Integrated Optoelectronics

Language: English

Topic: Photorefractive and Nonlinear Optics

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W50800091

FWCI: 0.216

Cites: 7

Cited by: 1

Related to: 10